Simulation and compact modeling of tunneling FET FinFET HEMT and emerging devices Device parameters extraction using Industry standard BSIM and ASM HEMT model Working on the enhancement of industry-standard compact model ASM-HEMT and BSIM DC IV RF S-parameters Pulsed IV Load Pull and Noise On-Wafer measurement of FinFET HEMT FDSOI MOSFET and Bulk MOSFET etc.
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